Microstructure characterization of Al-Mg alloys by X-ray diffraction line profile analysis
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Abstract
Microstructure characterization of Al - Mg alloy was discussed as a function of plastic deformation degrees (0%-35.46%).The changes in the microstructure have been studied by using X-ray diffraction line profile analysis (XDLP). The lattice parameter, crystallite size, average internal stress, microstrain and dislocation density of Al-Mg alloys were calculated. Both crystallite size and microstrain were found strongly contributing in the broadening of X-ray diffraction line. The obtained results showed that, the values of the crystallite size were found to be in the range of 480-540nm and the values of the residual internal stress were found to be in the range of (-1.74x109) – (-2.49x109) dy/cm2. Also, the values of microstrain and dislocation density were found to be in the range of 5.25x10–3 - 7?75x10–3 and 3.48x1010 - 6.18x1010 line/cm2, respectively.
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A.A.Akl and A.S.Hassanien (2014); Microstructure characterization of Al-Mg alloys by X-ray diffraction line profile analysis, Int. J. of Adv. Res., 2 (11), 0, ISSN 2320-5407.
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