SCALING CHALLENGES FOR ADVANCED TRANSISTOR DESIGN.
- Department Of Ece., K L University, Greenfields, Vaddeswaram.
- Abstract
- Keywords
- References
- Cite This Article as
- Corresponding Author
We all are living in the digital world where we are going to use many devices which are fabricated using the CMOS technology. Due to the constraint design of the circuits and long routing schemes we are going to make the chip work a lot harder and it results in high power consumption. In order to reduce the power consumption we prefer to use certain techniques like usage of nano-materials instead of conventional Poly-Silicon. In this technique we are interested to modify certain conditions which results in generation of a new kind of technology which results in low power consumed, high speed circuits and devices which make a new way in the world of electronics. To reduce the power consumption of transistor i.e., when compared with ordinary transistor we has to reduce the power consumption as well as the power dissipation [6]. So we propose the application of nano-materials which have high conductivity as well as low ? power dissipation which can be employed in design of Transistors of various technologies ( like 200nm., 100nm., 50nm. etc.,).
- High Performance Silicon Nanowire Field Effect Transistors Yi Cui, ZhaohuiZhong, Deli Wang, Wayne U. Wang, and Charles M. Lieber, Department of Chemistry and Chemical Biology, and Division of Engineering and Applied Science, Harvard University, Cambridge, Massachusetts 02138 Received November 1, 2002 (NANO LETTERS 2003 VOL 3, NO-2, 149-152.
- S. P. Wong, ?Beyond the conventional transistor,? Solid State Electronics, vol. 49, pp. 755-762, May 2005 s
- T. Park, J. P. Colinge, ?Multiple-gate SOI MOSFETs: device design guidelines,? IEEE Trans. Electron Devices, Vol. 49, No. 12, pp. 2222 -2229, Dec. 2002.
- IWAI Hiroshi, Natori Kenji, SHIRAISHI Kenji, IWATA Jun-ichi, OSHIYAMA Atsushi, YAMADA Keisaku, OHMORI Kenji, KAKUSHIMA Kuniyuki& AHMET Parhat, ? SI Nanowire FET and its modeling ?, ?Science China?, MAY 2011, Vol. 54, No-5:1004-1011, DOI:10,1007/s11432-011-4220-0.
- Paul, Ryan Tu, Shinobu Fujita, Masaki Okajima, Thomas H Lee ,Yoshio Nishi, ? An Analytical Compact Circuit Model for Nano Wire F?ET ?, IEEE Transactions on Electronic Devices, Vol. 54, No.7, July 2007.
- Variability Study of Si Nano-Wire FETs with different junction gradients by Jun-SikYoon,KihyunKim,Taiuk Rim and Chang-Ki Baek , AIP Advances 6,015318 (2016); doi :10.1063/1.4941351.
- Chau, S. Datta, and A. Majumdar, ?Opportunities and challenges of III?V nano-electronics for future high-speed, low-power logic applications,? in Proc. IEEE Compound Semiconductor Integr. Circuit Symp., Oct./Nov. 2005, pp. 17?20.
- Electronics of Conjugated Polymers : PolyAniline by Kerileng M. Molapo, Peter M. Ndangili, Rachel F. Ajayi, GcinekaMbambisa, Stephen M. Mailu, NjagiNjomo, MiluaMasikini, Priscilla Baker and Emmanuel I. Iwuoha , International Journal Of ELECTROCHEMICAL SCIENCE (2012) 11859-11875.
- Bowler, ?Atomic-Scale Nano-Wires : Physical & Electronic Structure?, J. Phys. cond. Matt., Vol. 16 PP R 721 - R754,2004.
- ?ATLAS User?s Manual Volume I, Silvaco International?, March 2007
- Vijay SaiPatnaik, AnkitGheedia and M.Jagadeesh Kumar,?3D Simulation of Nano-Wire FET?s using Quantum Models? ,The Simulation Standard : JULY, AUGUST, SEPTEMBER 2008.
[M.Anil Kumar, Y.N.S.SaiKiran, U.Jagadeesh, B.Balaram andM. DurgaPrakash. (2017); SCALING CHALLENGES FOR ADVANCED TRANSISTOR DESIGN. Int. J. of Adv. Res. 5 (May). 340-345] (ISSN 2320-5407). www.journalijar.com
ASSOCIATE PROFESSOR, KL University