Vol. 7 (01) pp. 994-1001 DOI: 10.21474/IJAR01/8413

MICROWAVE ELLIPSOMETRY CHARACTERIZATION OF ISOTROPIC MATERIALS USING SIMULATED ANNEALING COMBINED WITH LEVENBERG-MARQUARDT ALGORITHM

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  • Laboratoire Hubert Curien, UMR CNRS 5516, Universite Jean Monnet, Saint-Etienne, France.
  • Universite de N Djamena, Tchad.
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Abstract

The characterization of thick materials using microwave ellipsometry is known as non destructive technic. New microwave Ellipsometry has been developed and tested at different frequencies: in the 24-40 GHz frequency band and at 10 GHz. Several materials were characterized through this device using Levenberg-Marquardt optimization routine. Complex objective function with several local minima has been to be solved. Many recent works have shown that this routine has been very efficient in finding local minimum, but not for global minimum unless using some tricks. In this paper, we have combined two algorithms, namely simulated annealing and Levenberg-Marquardt algorithms, in order to enhance the characterization technic in finding the global optimum. Simulations were performed and concluded that the combined algorithm is more efficient than any of its basic algorithms. Experimental results on PTFE sample considering Cauchy dispersion model validated the simulation assumption.

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References

  1. H. Tompkins and Eugene A. Irene, Handbook of Ellipsometry, William Andrew, January 2005.
  2. Rothen, "The Ellipsometer, an Apparatus to Measure Thickness of Thin Surface Films," Rev. Sci. Instrum., vol. 26, p. 16:26, 1945.
  3. Azzam and N. Bashara, Light, Ellipsometry and polarized, Amsterdam: Elsevier science, 1987.
  4. Gambou, "Ellipsometry on a planar S-shape material," Progress In Electromagnetics Research Letters, vol. 9, p. 1?8, 2009.
  5. Gambou, B. Bayard and G. NoyeL, "Characterization of material anisotropy using microwave ellipsometry," Microwave and optical technology letters, vol. 53, no. 9, pp. 1996-1998, September 2011.
  6. Moungache, B. Bayard, A. M. Tahir, S. Robert, F. Gambou and D. Jamon, "Microwave oblique transmission ellipsometric method for measurement of thick and non-transparent materials," Revue Scientifique du CNAR, vol. 2, no. 1, pp. 38-43, 2013.
  7. Moungache, B. Bayard, AbakarMahamatTahir, S. Robert, D. Jamon and F. Gambou, "Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry," Microwave and Optical Technology Letters, vol. 57, no. 4, pp. 3039-3044, 2015.
  8. RimengayeNgarbaroumTobio, F. Gambou and J?r?me Mbainaibey, "Caracterisation de l'anisotropie des mat?riaux par polarimetrie hyperfr?quence ? 10 GHZ," Revu scientifique du Tchad, vol. 1, no. 3, 2013.
  9. Gambou, N. Djimrangar, K. Ngarguededjim, B. Bayard and A. Moungache, "Microwave Characterization of Chadian Palmyra Wood (Borassusaethiopum," Revuscientifique du Tchad, vol. 6, no. 4, pp. 119-126, 2018.
  10. Rajesh, K. Murali, H. Jantunen and R. Ratheesh, "The effect of filler on the temperature coefficient of the relative permittivity of PTFE/ceramic composites," Physica B Condens Matter, no. 406, p. 4312?4316, 2011.
  11. -C. Chen, H.-C. Lin and Y.-D. Lee, "The effects of filler content and size on the properties of PTFE/SiO2 composites," J Polym Res, no. 10, p. 247?258, 2003.
  12. Raoult, les ondes centimetriques, Paris?: Masson, 1958.
  13. Moungache, B. Bayard, A. M. Tahir, C. Thron, S. Robert and F. Gambou, "Calibration of a Three-Detector microwave ellipsometer," International Journal of Current Research, vol. 10, no. 12, pp. 76305-76312, 2018.
  14. Kanzowa, N. Yamashitab and M. Fukushimab, "Levenberg?Marquardt methods with strong local convergence properties for solving nonlinear equations with convex constraints," Journal of Computational and Applied Mathematics, vol. 172, no. 2, pp. 375-397, 2004.
  15. Kirkpatrick, C. D. Gelatt and M. P. Vecchi, "Optimization by Simulated Annealing," Science, New Series, vol. 220, no. 4598, pp. 671-680, May 13, 1983.
  16. Metropolis, A. Rosenbluth, M. Rosenhluth, A. Teller and E. Teller, "Equation of state calculations by computing machines," The Journal of Chemical and Physics, no. 21, pp. 1087-1092, 1953.
  17. Dekkers and E. Aarts, "Global optimization and optimization annealing," Mathematical Programming, no. 50, pp. 367-393, 1991.
  18. Mahdi, S. A. Medjahed and M. Ouali, "Performance Analysis of Simulated Annealing Cooling Schedules in he Context of Dense Image Matching," Computation y Systemas , vol. 21, no. 3, pp. 493-501, 2017.

How to Cite This Article

A. Moungache, B. Bayard and S. Robert (2019); MICROWAVE ELLIPSOMETRY CHARACTERIZATION OF ISOTROPIC MATERIALS USING SIMULATED ANNEALING COMBINED WITH LEVENBERG-MARQUARDT ALGORITHM, Int. J. of Adv. Res., 7 (01), 994-1001, ISSN 2320-5407. DOI: https://doi.org/10.21474/IJAR01/8413

Corresponding Author

A. Moungache
Laboratoire Hubert Curien, UMR CNRS 5516, Université Jean Monnet, Saint-Etienne, France
Creative Commons Attribution 4.0 This work is licensed under a Creative Commons Attribution 4.0 International License.