Vol. 3 (10) pp. 778-788

Structural Studies on Quaterthiophene (QT) Thin Films

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  • School of Technology and Applied Sciences, Mahatma Gandhi University, Pullarikkunnu Campus,Mallooserry PO, Kottayam, Kerala-686 041, India.
  • Dayananda Sagar College of Engineering, Bangalore-560078, India.
  • Interdisciplinary Centre for Science and Technology (CSIR) Thiruvananthapuram, India.
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Abstract

Quaterthiophene (QT) thin films are prepared by vacuum vapour deposition method. The X-ray diffraction pattern for QT films deposited at room temperature (RT) and various annealing temperatures are studied. Their grain size and inter planar spacing are determined for various annealing temperatures. The QT thin films are reported to have a maximum inter planar spacing and minimum grain size at RT. Also reported that the grain size increases and the inter planar spacing decreases with increase in annealing temperatures. Indexing of prominent peaks is carried out and peaks are identified.

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How to Cite This Article

V Sasidharan, CM Joseph, KN Narayanan Unni and K Shreekrishnakumar (2015); Structural Studies on Quaterthiophene (QT) Thin Films, Int. J. of Adv. Res., 3 (10), 778-788, ISSN 2320-5407.

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V Sasidharan1

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