20Jan 2017

Screening of Resistance source against spot blotch disease caused by Bipolaris sorokiniana in Triticum aestivum L.

  • Senior Research Fellow, Indian Institute of Wheat and Barley Research, Karnal-132001 (Haryana), India. Principal Scientist, Indian Institute of Wheat & Barley Research, Karnal-132 001 (Haryana), India.
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One hundred spring wheat genotypes/ germplasm (Triticum aestivum L.) lines related to Indian, CIMMYT, and Chinese were evaluated for spot blotch tolerance against natural epiphytotic conditions, caused by Bipolaris sorokiniana at hot spot locations Coochbehar, Kalyani and Karnal (Polyhouse), India Out of 100 screened entries 20 number of genotype showed Highly resistant or Immune to the disease, where as 28 genotype were resistant, 22 genotypes moderately resistant, 15 moderately susceptible and 15 genotypes susceptible. Indian germplasm lines tended to be more susceptible compression to lines originated from CIMMYT and China. Chirya-1, chirya-3, chirya-7, Yangmai#6 and Mayoor, HRLSN lines from CIMMYT and LBRL lines from India showed high degree of resistance to the disease both under field and polyhouse conditions. On the basis of the disease severity under artificial epiphytotic polyhouse conditions, 20 promising lines were find highly resistant in field natural conditions for their genetic analysis & potential for spot blotch breeding. These lines can be used hybridization programmes and since they have different parental background, it will help in diversification of gene pool. Some of these also have better potential for high yield and adaptation.

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[Ashish Ojha, Gyanendra Singh, Bhudev Singh Tyagi, Virender Singh, Rajita and Pradeep Kumar. (2017); Screening of Resistance source against spot blotch disease caused by Bipolaris sorokiniana in Triticum aestivum L. Int. J. of Adv. Res. 5 (1). 23-28] (ISSN 2320-5407). www.journalijar.com

Ashish Ojha


Article DOI: 10.21474/IJAR01/2716       DOI URL: http://dx.doi.org/10.21474/IJAR01/2716

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