DISPERSION CHARACTERISTICS OF TRAPPED INVERTED MICROSTRIP LINES.

Trapped Inverted microstrip lines are studied for their dispersion characteristics using Galerkin’s Technique in Spectral Domain. Basis functions for the unknown strip current are chosen according to the structure of the line. For theoretical analysis, Fourier transform of the basis functions from space domain to spectral domain are considered. The line is analyzed for dispersion characteristics in the X-band corresponding to different values of the side and top wall separations so that limits for separation of the shielding walls may be determined beyond which no effect of shielding is discernable. Again the effect of strip width on the dispersion characteristics is also studied for different values of relative permittivity of the substrate.